The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Oct. 25, 2023
Applicant:

Tata Consultancy Services Limited, Mumbai, IN;

Inventors:

Abhijeet Gorey, Kolkata, IN;

Arpan Pal, Kolkata, IN;

Subhadeep Basu, Kolkata, IN;

Chirabrata Bhaumik, Kolkata, IN;

Annesha Mazumder, Kolkata, IN;

Tapas Chakravarty, Kolkata, IN;

Arijit Sinharay, Kolkata, IN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); G01B 17/02 (2006.01); G01N 29/12 (2006.01); G01N 29/22 (2006.01); G01N 29/24 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0666 (2013.01); G01B 11/0616 (2013.01); G01B 17/025 (2013.01); G01N 29/12 (2013.01); G01N 29/223 (2013.01); G01N 29/2418 (2013.01); G01N 29/4436 (2013.01); G01N 2291/0231 (2013.01); G01N 2291/02854 (2013.01);
Abstract

This disclosure relates to non-destructive estimation of coating layer thickness based on sweep frequency photo acoustic guided wave technique. Coating of a substrate/surface protects it from wear, corrosion and serves the cosmetic aspect, hence making coating technology is an essential part industrial process. The existing techniques for coating thickness determination are either destructive or requires a prior knowledge of the refractive index of the surface under investigation or use of sophisticated instrumentation, complicated procedure and harmful radiation during industrial deployment. The disclosure utilizes an intensity modulated Continuous Wave (CW) laser diode to excite a sample thus, making the technique a partially contact based method. Further a calibration curve is plotted by determining a frequency spectrum and resonance frequency. The calibration curve is used for estimation of a coating layer thickness.


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