The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Mar. 26, 2025
Applicant:

Brother Kogyo Kabushiki Kaisha, Nagoya, JP;

Inventors:

Takashi Nakano, Ama, JP;

Mika Matsushima, Ichinomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D05B 19/12 (2006.01); D05B 19/10 (2006.01); D05B 79/00 (2006.01);
U.S. Cl.
CPC ...
D05B 19/12 (2013.01); D05B 19/10 (2013.01); D05B 79/00 (2013.01);
Abstract

A sewing machine includes a bed, a projector, and a controller. The controller is configured to control the projector to project a projection image onto a projection region on the bed. The projection image includes a pattern image representing a sewing pattern and a projection setting object for instructing setting of the sewing pattern. The controller is configured to, in response to selection of the projection setting object during a period in which the projection image is being projected, perform the setting of the sewing pattern. The controller is configured to change at least a size or an arrangement of the projection setting object in the projection image.


Find Patent Forward Citations

Nakano, Takashi. (2026). Sewing machine and sewing machine control method (U.S. Patent No. 12668904). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12668904

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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