The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Oct. 07, 2024
Applicant:

Yazaki Corporation, Tokyo, JP;

Inventors:

Yuki Takahashi, Susono, JP;

Yoshihiro Takahashi, Susono, JP;

Jungang Guan, Susono, JP;

Assignee:

YAZAKI CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60W 40/08 (2012.01); G06V 20/59 (2022.01); G06V 40/10 (2022.01); G06V 40/20 (2022.01);
U.S. Cl.
CPC ...
B60W 40/08 (2013.01); G06V 20/597 (2022.01); G06V 40/10 (2022.01); G06V 40/20 (2022.01); B60W 2420/403 (2013.01); B60W 2540/221 (2020.02);
Abstract

An abnormality detection device includes a motion detection unit that detects a motion indicating pain associated with a disease of a body of a driver based on motion information of the driver acquired by a camera, a behavior detection unit that detects abnormal behavior of a vehicle based on behavior information acquired by a vehicle behavior information acquisition unit, a biometric information detection unit that detects biometric information that is an abnormal sign of the driver based on biometric information acquired by the biometric information acquisition unit, and an abnormal sign determination unit that determines whether the driver shows an abnormal sign in the body by using all or some of a detection result of the motion detection unit, a detection result of the behavior detection unit, and a detection result of the biometric information detection unit.


Find Patent Forward Citations

Takahashi, Yuki. (2026). Abnormality detection device, abnormality detection method, and abnormality detection program (U.S. Patent No. 12668249). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12668249

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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