The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Sep. 13, 2022
Applicant:

Stratasys Powder Production Ltd., London, GB;

Inventor:

Gianluca Dorini, London, GB;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/00 (2017.01); B29C 64/153 (2017.01); B29C 64/393 (2017.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 40/00 (2020.01); B33Y 40/10 (2020.01); B33Y 50/00 (2015.01); B33Y 50/02 (2015.01); G01J 5/10 (2006.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B29C 64/153 (2017.08); B33Y 10/00 (2014.12); B33Y 40/10 (2020.01); B33Y 50/02 (2014.12); G01J 5/10 (2013.01); G01J 2005/106 (2013.01);
Abstract

A method of manufacturing 3D objects with an apparatus having first and second heat sources and a thermal sensor. The method includes carrying out a build process after a thermal calibration process for a thermal control component(s). The calibration and build processes include a layer cycle including (i) providing a layer of particulate material defining a build bed surface; (ia) heating the surface; (ii) depositing absorption modifier over a layer-specific region and/or a surrounding area; (iii) heating the layer-specific region with the first heat source; and (iv) measuring a temperature of the surface after at least one of (i) to (iii). The layer cycle includes heating the surface of each layer with the second heat source and repeating until the calibration/build processes are complete. The outcome of each calibration routine being based on the measured temperature and being applied to the thermal control component for the subsequent layer cycle.


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