The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Dec. 24, 2025
Applicants:

Geonwoo Solution, Seoul, KR;

Eggstone Co., Ltd, Seoul, KR;

Elite Sigma Solution Llc, Vancouver, WA (US);

Inventors:

Samuel Seok Jae Jeong, Vancouver, WA (US);

In Jae Chung, Gyeonggi-do, KR;

Ji Hoon Chung, Seoul, KR;

Shin Won Yu, Seoul, KR;

Assignees:

Geonwoo Solution, Seoul, KR;

Eggstone CO., LTD, Seoul, KR;

Elite Sigma Solution LLC, Vancouver, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07C 5/342 (2006.01); B07C 1/18 (2006.01); B07C 5/36 (2006.01);
U.S. Cl.
CPC ...
B07C 5/3425 (2013.01); B07C 1/18 (2013.01); B07C 5/3422 (2013.01); B07C 5/368 (2013.01); B07C 2501/009 (2013.01);
Abstract

A bean defect sorter includes a container configured to store beans, a transfer guide configured to receive the beans from the container and to guide each bean in series, the transfer guide being configured to discharge the beans one by one, a rotary configured to rotate in a predetermined direction and to receive each of the beans discharged from the bean dispenser, an imaging device configured to provide a bean image of one or more of the beans, a processor including a learning algorithm that is configured to classify each bean as one of a normal bean, a defective bean, and an indeterminable bean, a bean sorter configured to discharge each bean from the rotary by using air pressure according to a classification result, a storage configured to store each of the normal bean, the defective bean, and the indeterminable bean, and a residual bean collector to process escaped beans.


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