The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Mar. 09, 2023
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Keisuke Kawamoto, Tokyo, JP;

Keisuke Eguchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); G11C 5/06 (2006.01); H01L 21/768 (2006.01); H01L 23/495 (2006.01); H10B 51/10 (2023.01); H10B 51/20 (2023.01); H10D 30/01 (2025.01); H10D 30/47 (2025.01); H10D 62/85 (2025.01); H10D 64/64 (2025.01); H10H 20/852 (2025.01); H10H 20/857 (2025.01); H10W 72/50 (2026.01); H10W 72/59 (2026.01); H10W 72/90 (2026.01); H10W 90/00 (2026.01);
U.S. Cl.
CPC ...
H10W 90/00 (2026.01); H10W 72/547 (2026.01); H10W 72/90 (2026.01); H10W 72/59 (2026.01); H10W 90/753 (2026.01);
Abstract

An object is to provide a technique capable of improving productivity of a semiconductor device by reducing a wiring length of a wire. A semiconductor device includes a semiconductor element and a control IC controlling the semiconductor element, wherein the semiconductor element includes a pair of signal pad groups made up of a plurality of signal pads, the control IC includes a plurality of signal pads, the plurality of signal pads in the control IC are wire-bonding connected to the signal pad group closer to the plurality of signal pads in the control IC in the pair of signal pad groups in the semiconductor element.


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