The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2026
Filed:
Oct. 29, 2021
Mianyang Boe Optoelectronics Technology Co., Ltd., Mianyang, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Liangliang He, Beijing, CN;
Wenli Zhang, Beijing, CN;
Mianyang BOE Optoelectronics Technology Co., Ltd., Mianyang, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
An array substrate, a testing method and manufacturing method thereof, and a displaying device. According to the disclosure, a plurality of test capacitors connected in parallel, a first connecting wire, a second connecting wire, a first test terminal and a second test terminal are arranged in an array substrate located in a test area, each test capacitor comprises a first electrode, a first insulating layer and a second electrode which are stacked on a base, and each test capacitor has the same film structure as a storage capacitor arranged in an active area. By making the first electrode of each test capacitor in the test area connected to the first test terminal through the first connecting wire, and the second electrode of each test capacitor connected to the second test terminal through the second connecting wire, the plurality of test capacitors are connected in parallel.