The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Apr. 27, 2021
Applicant:

Sony Semiconductor Solutions Corporation, Kanagawa, JP;

Inventor:

Tetsuo Gocho, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10W 20/00 (2026.01); H10F 39/00 (2025.01); H10F 39/12 (2025.01); H10W 20/20 (2026.01); H10W 20/40 (2026.01); H10W 20/46 (2026.01); H10W 20/47 (2026.01); H10W 20/48 (2026.01);
U.S. Cl.
CPC ...
H10F 39/811 (2025.01); H10F 39/011 (2025.01);
Abstract

Parasitic capacitance in a through-silicon via (TSV) is reduced. A semiconductor apparatus includes a given layer. A via vertically penetrates the given layer. A conductor is in contact with an upper surface side material and a lower surface side material of the vertically penetrated layer. The conductor forms, between the conductor and an inside of the via, a cavity portion that vertically penetrates the layer without being in contact with the inside of the via. At least either the upper surface side material or the lower surface side material of the layer is a conductive material, and at least part of the conductive material includes an opening portion for the cavity portion. This opening portion is used to supply an etchant during etching.


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