The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Nov. 13, 2023
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Mitul Vohra, Hyderabad, IN;

Hitesh Jain, Hyderabad, IN;

Sarath Kumar Pujari, Hyderabad, IN;

Ansah Ahmed Sheik, Hyderabad, IN;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/00 (2018.01); H04W 24/08 (2009.01); H04W 24/10 (2009.01); H04W 76/28 (2018.01); H04L 1/00 (2006.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04W 24/08 (2013.01); H04W 76/28 (2018.02); H04L 1/0026 (2013.01);
Abstract

This disclosure provides systems, methods and apparatus, including computer programs encoded on computer storage media for a UE to prioritize gapless measurements. The UE receives an enquiry for capabilities of the UE with respect to a set of bands. The UE determines a portion of the set of bands that can be measured without a measurement gap. The UE indicates a status of the UE to measure all of the bands in the set of bands without a measurement gap when the portion of the set of bands is greater than a first threshold or connected mode discontinuous reception (CDRX) is configured. The UE receives a configuration for inter-band measurements without a measurement gap. The UE transmits a measurement report for inter-band measurements without a measurement for one or more bands that the UE cannot measure without a measurement gap.


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