The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2026
Filed:
Dec. 21, 2021
Applicant:
Zte Corporation, Guangdong, CN;
Inventors:
Xinquan Ye, Guangdong, CN;
Shujuan Zhang, Guangdong, CN;
Yijian Chen, Guangdong, CN;
Guanghui Yu, Guangdong, CN;
Zhaohua Lu, Guangdong, CN;
Assignee:
ZTE CORPORATION, Guangdong, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); H04L 5/00 (2006.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04L 5/0048 (2013.01); H04L 5/0082 (2013.01);
Abstract
Provided are a large-scale property parameter measurement method and apparatus, a node and a storage medium. The large-scale property parameter measurement method includes acquiring indication information which includes quasi co-location (QCL) association information and first time window information and measuring a large-scale property parameter of a first reference signal according to the indication information.