The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

May. 17, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Daehee Park, Suwon-si, KR;

Janghoon Han, Suwon-si, KR;

Chonghwa Seo, Suwon-si, KR;

Jongwon Lee, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q 1/24 (2006.01); H01Q 3/28 (2006.01); H03F 3/24 (2006.01);
U.S. Cl.
CPC ...
H01Q 3/28 (2013.01); H01Q 1/243 (2013.01); H03F 3/245 (2013.01); H03F 2200/451 (2013.01);
Abstract

A method performed by an electronic device, includes: generating a beamforming signal by using a first antenna and a second antenna; increasing a first input value of a first power amplifier and a second input value of a second power amplifier, based on performance of the beamforming signal being deteriorated; measuring a first output value of the first power amplifier based on the increased first input value and measuring a second output value of the second power amplifier based on the increased second input value; and determining, based on the measured first output value and the measured second output value, at least one of the first power amplifier or the second power amplifier is deteriorated in performance, and connecting a first attenuator or a second attenuator electrically to the deteriorated power amplifier.


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