The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Jul. 01, 2020
Applicant:

Montana Instruments Corporation, Bozeman, MT (US);

Inventors:

Josh Doherty, Bozeman, MT (US);

William Baker, Broomfield, CO (US);

Anjan Reijnders, Groton, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01F 6/04 (2006.01); F17C 3/08 (2006.01); F25J 1/02 (2006.01); G01N 1/42 (2006.01); H05K 7/20 (2006.01);
U.S. Cl.
CPC ...
H01F 6/04 (2013.01); F17C 3/085 (2013.01); F25J 1/0276 (2013.01); G01N 1/42 (2013.01); H05K 7/2029 (2013.01); H05K 7/20372 (2013.01); H05K 7/20381 (2013.01); F17C 2221/017 (2013.01);
Abstract

Cryogenic analytical systems are provided that can include: a cryogenic fluid source; one or more analysis components; at least one cryogenic thermal conduit operably coupled between the cryogenic fluid source and the one or more analysis components; and a pressure control component operably engaged with the cryofluid source. Methods for performing cryogenic analysis are provided. The methods can include adjusting the pressure of cryofluid within a cryogenic fluid source to configure one or more analysis components with a cryogenic temperature. Methods for configuring a cryogenic analytical system to perform cryogenic analysis are also provided. The methods can include: increasing the pressure within a cryogenic fluid source to rapidly cool one or more analysis components to a first temperature; and decreasing the pressure within the cryogenic fluid source to reduce the first temperature of the one or more analysis components.


Find Patent Forward Citations

Loading…