The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2026
Filed:
Dec. 29, 2023
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Daichi Adachi, Tokyo, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G06T 7/00 (2017.01); G06T 19/20 (2011.01);
U.S. Cl.
CPC ...
G06T 17/00 (2013.01); G06T 7/0002 (2013.01); G06T 19/20 (2013.01); G06T 2200/24 (2013.01); G06T 2207/20084 (2013.01); G06T 2219/2021 (2013.01);
Abstract
To make it possible to easily identify a silhouette image causing a hole or chip having occurred in a 3D model and an imaging device corresponding to the silhouette image. Defect region information identifying a defect region of a 3D model representing a three-dimensional shape of an object, which is generated based on a plurality of silhouette images, is set. Then, the defect region identified by the set defect region information is associated with the plurality of silhouette images and results of the association are displayed.