The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2026
Filed:
Feb. 07, 2023
Canon Kabushiki Kaisha, Tokyo, JP;
Shuhei Toba, Kanagawa, JP;
Yoji Yamamoto, Tokyo, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
Provided is a cell image analysis method which enables accurate grasping of a change point of a colony in cell culture. The cell image analysis method includes: a data acquisition step of acquiring cell image data generated in time series in the cell culture; a cell region extraction step of extracting cell regions from the cell image data; a data calculation step of calculating, for each of the cell regions, data about a size of the cell region; and a change point detection step of detecting, based on the data about the size of the cell region calculated in the data calculation step, the change point, which is timing of a change in a state of the colony.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile