The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2026
Filed:
Mar. 20, 2024
Fujifilm Corporation, Tokyo, JP;
Tomoharu Shimada, Saitama, JP;
Shinichi Shimotsu, Saitama, JP;
Tetsuya Fujikawa, Saitama, JP;
Tomoyuki Kawai, Saitama, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
The present disclosure provides an image processing device, an imaging apparatus, an image processing method, and an image processing program capable of accurately extracting an abnormal region of a subject from an image. In the image processing device according to one aspect of the present invention, a processor generates a first mask image showing a first region where an abnormality exists on a surface of a subject and a second region including a region where an abnormality exists inside the subject, based on a visible image and a first near-infrared image, acquires a second near-infrared image of the subject captured with light in a second wavelength range in a state where the subject is held in focus with the light in the second wavelength range, and extracts an abnormal region in the first region and the second region based on the first mask image and the second near-infrared image.