The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Jun. 21, 2022
Applicant:

Xanadu Quantum Technologies Inc., Toronto, CA;

Inventors:

Ish Dhand, Ulm, DE;

Shreya Prasanna Kumar, Ulm, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 10/40 (2022.01); G06N 10/60 (2022.01);
U.S. Cl.
CPC ...
G06N 10/40 (2022.01); G06N 10/60 (2022.01);
Abstract

A method includes causing activation, at a first time, of a first set of squeezed light sources from a plurality of squeezed light sources of a Gaussian boson sampling (GBS) circuit. At a second time after the first time, a first photon statistic is detected at a first output port from a plurality of output ports of the GBS circuit. At a third time after the first time, a second set of squeezed light sources from the plurality of squeezed light sources of the GBS circuit is activated, the second set of squeezed light sources being different from the first set of squeezed light sources. At a fourth time after the third time, a second photon statistic is detected at a second output port from the plurality of output ports of the GBS circuit. At least one transformation matrix is estimated that represents a linear optical interferometer of the GBS circuit based on the first photon statistic and the second photon statistic.


Find Patent Forward Citations

Dhand, Ish. (2026). Methods for in-situ characterization of gaussian boson sampling (gbs) devices (U.S. Patent No. 12664455). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12664455

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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