The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Jun. 29, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yoshiaki Sakae, Tokyo, JP;

Kazuhiko Isoyama, Tokyo, JP;

Jun Nishioka, Tokyo, JP;

Yuji Kobayashi, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07C 5/08 (2006.01); G06N 5/046 (2023.01); G07C 5/00 (2006.01);
U.S. Cl.
CPC ...
G06N 5/046 (2013.01); G07C 5/008 (2013.01); G07C 5/0808 (2013.01); G07C 5/0825 (2013.01);
Abstract

An information processing deviceX mainly includes a selection meansX and an inference meansX. The selection meansX is configured to select, based on one or more geographical center points according to a movement history of an inference target device, one or more adaptive inference models to be used from inference models generated on an area-by-area basis, the inference models making inferences of a state of the inference target device. The inference meansX is configured to make an inference of the state of the inference target device based on inference results of the adaptive inference models which use data acquired by the inference target device.


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