The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Jul. 28, 2022
Applicant:

Equifax Inc., Atlanta, GA (US);

Inventors:

Howard H. Hamilton, Atlanta, GA (US);

Jeffery Dugger, Atlanta, GA (US);

Assignee:

Equifax Inc., Atlanta, GA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06N 3/09 (2023.01); G06Q 10/0635 (2023.01); H04W 12/67 (2021.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/09 (2023.01); G06Q 10/0635 (2013.01); H04W 12/67 (2021.01);
Abstract

A method can be used to predict risk using machine learning models having efficient feature learning. A risk prediction model can be applied to time-series data associated with a target entity to generate a risk indicator. The risk prediction model can include a feature learning model for generating features from the time-series data. The risk prediction model can also include a risk classification model for generating the risk indicator. The feature learning model can include filters and can be trained. Parameters of the risk prediction model can be adjusted to minimize a loss function associated with risk indicators. An updated risk prediction model can be generated by removing a filter from an original set of filters based on influencing scores of the original filters. The risk indicator can be transmitted to a computing device for use in controlling access of the target entity to a computing environment.


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Hamilton, Howard. (2026). Machine learning models with efficient feature learning (U.S. Patent No. 12664421). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12664421

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