The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2026
Filed:
Jan. 27, 2025
Applicant:
Sick Ag, Waldkirch, DE;
Inventors:
Assignee:
SICK AG, Waldkirch, DE;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/14 (2006.01);
U.S. Cl.
CPC ...
G06K 7/1473 (2013.01); G06K 7/1417 (2013.01); G06K 7/1447 (2013.01); G06K 7/1452 (2013.01); G06K 7/1465 (2013.01);
Abstract
A method of reading an optical code (); is provided, the method comprising the steps of recording image data having the optical code (); determining defects (), and evaluating the image data by reading the code words. In this respect, the defects () are determined using an edge criterion and/or a binarization criterion, wherein the edge criterion evaluates whether there is a code module in an edge-free region of the image data that is larger than a specified multiple of the module size, and wherein the binarization criterion evaluates whether a code module having gray scale values close to a binarization threshold has been recorded.