The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Sep. 30, 2024
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Aarthi Ravi, San Jose, CA (US);

Mihir Kumar Choudhary, Morgan Hill, CA (US);

Sharad Singh, Fremont, CA (US);

Kai Fan Tang, Port Coquitlam, CA;

Valery Yalauchuk, London, GB;

Stephen Haines, Danville, CA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/215 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01);
Abstract

A data conformance service determines, based at least on an information model of a machine at a remote site of a client, cloud test code to be executed by the data conformance service to perform at least a first type of conformance test for data provided by the machine and edge test code to be executed by an edge gateway at the remote site to perform at least a second type of conformance test for the data from the machine. The service deploys the edge test code to the edge gateway. The service receives data from the machine and executes the cloud test code using the data to generate cloud test results. The service receives edge test results and generates, based on the cloud and edge results, an indication of whether the data from the machine conforms to a specification.


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