The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2026
Filed:
Jan. 06, 2023
Dell Products L.p., Round Rock, TX (US);
Huijuan Fan, Chengdu, CN;
Bob Biao Yan, Chengdu, CN;
Dell Products L.P., Round Rock, TX (US);
Abstract
Methods, system, and non-transitory processor-readable storage medium for test coverage optimizing system are provided herein. An example method includes executing at least one test case on a system. A weighted average baseline metrics calculation module calculates a weighted average baseline metric for at least one test case using test related failures that occurred during the execution. A coverage imbalance module calculates a coverage imbalance associated with a test domain using the weighted average baseline metric, where the test domain comprises the at least one test case.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile