The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Jun. 20, 2022
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Yi Dai, Beijing, CN;

Ling Zhuo, Beijing, CN;

Ying Cao, Beijing, CN;

Yin Xia, Beijing, CN;

Junfei Shen, Hangzhou, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 18/211 (2023.01);
U.S. Cl.
CPC ...
G06F 11/0751 (2013.01); G06F 11/0709 (2013.01); G06F 18/211 (2023.01);
Abstract

First event data is obtained from a first computer system and second event data is obtained from a second computer system. A first shape of the first event data is identified, and a second shape of the second event data is identified. A shape similarity between the first shape and the second shape is calculated. The shape similarity is determined to be above a similarity threshold. Training features are generated from the first event data and the second event data based on the determining. The training features are input into an anomaly-detection model.


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