The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Feb. 05, 2024
Applicant:

Georgia Tech Research Corporation, Atlanta, GA (US);

Inventors:

Ekansh Gupta, Atlanta, GA (US);

Raghupathy Sivakumar, Atlanta, GA (US);

Cheng-Yeh Chen, Atlanta, GA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/01 (2006.01); B25J 13/08 (2006.01);
U.S. Cl.
CPC ...
G06F 3/015 (2013.01); B25J 13/08 (2013.01);
Abstract

An exemplary system and method are disclosed that can detect unobserved and unobservable signals in a subject, or system, using an auxiliary, secondary signal measured from the subject while the unobserved and unobservable signals are known to be present. In particular, the exemplary system and method can used to measure observed signals, e.g., in a nonlinear time-variant system (NLTV system) such as the brain, to measure the unobserved or unobservable signal of interest via response coupling that employs a test instrument configured to facilitate interactions between the primary and the auxiliary signal.


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