The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Sep. 23, 2022
Applicant:

E-scopics, Aix-en-Provence, FR;

Inventors:

Baptiste Hériard-Dubreuil, Aix-en-Provence, FR;

Adrien Besson, Marseilles, FR;

Frédéric Wintzenrieth, Aix-en-Provence, FR;

Claude Cohen-Bacrie, Aix-en-Provence, FR;

Assignee:

E-SCOPICS, Aix-en-Provence, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/52 (2006.01); G01S 15/89 (2006.01);
U.S. Cl.
CPC ...
G01S 7/52036 (2013.01); G01S 7/52046 (2013.01); G01S 15/8977 (2013.01);
Abstract

The present invention relates to a method and device for analysing a medium based on: —emitting plane or spiral emission waves (O) each having a respective emission angle, —receiving reception signals representative of plane or spiral reception waves (O) each having a respective reception angle, each reception signal including a singly scattered component and a multiply scattered component, —processing the reception signals to extract the singly scattered component and/or the multiply scattered component of said reception signals.


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