The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Jul. 30, 2024
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Shilpa Gupta, Rohini, IN;

Hubert Martin Bode, Haar, DE;

Rishi Bhooshan, Noida, IN;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01); H10W 42/20 (2026.01); H10W 42/40 (2026.01);
U.S. Cl.
CPC ...
G01R 29/0878 (2013.01); H10W 42/20 (2026.01); H10W 42/40 (2026.01);
Abstract

A semiconductor device includes a secured circuit, an electromagnetic interference (EMI) sensor over a surface of the secured circuit, and a sensing circuit. The EMI sensor is configured to receive a reference voltage and the EMI sensor includes at least one of electric (E) field sensor or a magnetic (H) field sensor. The sensing circuit includes a hysteresis comparator and a voltage level comparator. The hysteresis comparator has a first input coupled to a first node of the EMI sensor via a low pass filter, a second input directly connected to the first node, and an output configured to provide an output indicative an EMI attack. An antenna portion of the EMI sensor includes the first node and is coupled between inputs of the voltage level comparator, in which the voltage comparator is configured to provide an output indicative of a physical tampering with the antenna portion.


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