The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Aug. 12, 2023
Applicant:

Contemporary Amperex Technology (Hong Kong) Limited, Hong Kong, CN;

Inventors:

Fenglin Zhang, Ningde, CN;

Jianlin Liu, Ningde, CN;

Shaoteng Ren, Ningde, CN;

Yingqin Su, Ningde, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); H01M 10/42 (2006.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); H01M 10/4285 (2013.01); G01N 2223/1016 (2013.01);
Abstract

An inspection method includes obtaining an image of a corner region of the wound cell that includes an image of a cathode electrode plate at N layers of the corner region of the wound cell and an anode electrode plate at the N layers, and determining, based on the image of the corner region, amounts of misalignment between the cathode electrode plate and the anode electrode plate that are adjacent in the wound cell. N is a positive integer.


Find Patent Forward Citations

Zhang, Fenglin. (2026). Inspection method and inspection apparatus for wound cell (U.S. Patent No. 12663385). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12663385

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…