The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Oct. 20, 2023
Applicant:

Hamamatsu Photonics K.k., Hamamatsu, JP;

Inventor:

Satoshi Yamamoto, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 23/56 (2023.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6456 (2013.01); G01N 2201/11 (2013.01); G01N 2201/127 (2013.01);
Abstract

In a sample observation device, an image capturing unit includes an area image sensor that performs image capturing by the rolling shutter method in which a start of an exposure period of pixel columns in the pixel region is shifted by predetermined time, and a control unit controls the image capturing unit so that an exposure order in each of the pixel columns is reversed between a period in which a scanning unit scans a sample in a first direction and a period in which the scanning unit scans the sample in a second direction.


Find Patent Forward Citations

Yamamoto, Satoshi. (2026). Sample observation device and sample observation method (U.S. Patent No. 12663375). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12663375

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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