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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12663354 B1

PDFFull Text
Date of Patent:
Jun. 23, 2026

Filed:

Jan. 17, 2023

Dilution mechanism, particle size distribution measurement system, particle size distribution measurement method, and program for particle size distribution measurement

Applicants:

Horiba, Ltd., Kyoto, JP;

Horiba Advanced Techno, Co., Ltd., Kyoto, JP;

Inventors:

Keijiro Sakuramoto, Kyoto, JP;

Tetsuya Mori, Kyoto, JP;

Kazunori Habu, Kyoto, JP;

Assignees:

HORIBA, LTD., Kyoto, JP;

HORIBA ADVANCED TECHNO, CO., LTD., Kyoto, JP;

Attorney:

LUCAS & MERCANTI, LLP

Primary Examiner:

MD M Rahman

Int. Cl.
CPC ...
G01N 15/06 (2024.01); G01N 1/38 (2006.01); G01N 15/14 (2024.01);
U.S. Cl.
CPC ...
G01N 15/0656 (2013.01); G01N 1/38 (2013.01); G01N 15/1425 (2013.01); G01N 2015/1493 (2013.01);
Abstract

A dilution mechanism includes: a sample line that guides the sample containing the particles to the particle size distribution measurement device; a dilution line that merges with the sample line and through which a diluent flows; a concentration adjusting unit that adjusts the concentration of the particles contained in the diluted sample; a conductivity measuring unit that measures a conductivity of the diluted sample; a control unit that controls the concentration adjusting unit to bring the conductivity measured by the conductivity measuring unit or a conductivity-related value that is a value calculated from the conductivity, to a predetermined target value.

Find Patent Forward Citations

Sakuramoto, Keijiro. (2026). Dilution mechanism, particle size distribution measurement system, particle size distribution measurement method, and program for particle size distribution measurement (U.S. Patent No. 12663354). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12663354

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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