The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Jan. 24, 2024
Applicant:

Reduct NV, Schelle, BE;

Inventor:

Hans Van Nieuwenhuyze, Wilrijk, BE;

Assignee:

REDUCT NV, Schelle, BE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 25/00 (2006.01); F16L 101/30 (2006.01); G01C 21/16 (2006.01);
U.S. Cl.
CPC ...
G01C 25/005 (2013.01); F16L 2101/30 (2013.01);
Abstract

Method and system for calibration of a measurement device for mapping underground pipelines. The method comprises the steps of mounting the measurement device on a calibration device configured for performing a calibration program on the measurement device, and executing the calibration program by means of the calibration device. The system is configured for performing the calibration method.


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Van Nieuwenhuyze, Hans. (2026). Method and system for calibration of measurement device for mapping underground pipelines (U.S. Patent No. 12663293). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12663293

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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