The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2026
Filed:
Mar. 11, 2023
Leica Geosystems Ag, Heerbrugg, CH;
Christian Niklaus, Bad Ragaz, CH;
Bianca Gordon, Rebstein, CH;
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
A survey instrument comprising a single point measurement unit, a point cloud measuring module, and a computing unit. The single point measurement unit is configured to generate first measurement data comprising coordinates a point. The point cloud measuring module has a fixed pose relative to the single point measurement unit, and configured to generate a second measurement data comprising coordinates of a plurality of points. The computing unit stores calibration parameters and is configured to generate a point cloud based on the second measurement data, to merge it with the first measurement data and to detect surfaces and object edges in it. The survey instrument is configured to execute a calibration using object edges in the setting. The single point measurement unit acquires a set of single measuring points including at least two on each flat surfaces of the object edges.