The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2026
Filed:
Sep. 12, 2024
Denso Wave Incorporated, Chita-gun, JP;
Yusuke Mitani, Chita-gun, JP;
DENSO WAVE INCORPORATED, Aichi-Pref., JP;
Abstract
A three-dimensional measurement apparatus includes: a projection device projecting a predetermined stripe pattern on a measurement object; an imaging device capturing an image of the measurement object on which the predetermined stripe pattern is projected; a measurement device measuring a three-dimensional shape of the measurement object using a phase shift method by determining stripe pattern information from the image captured by the imaging device; and a controller controlling the projection device. The measurement device determines, in the image captured by the imaging device, the stripe pattern information on a pixel-by-pixel basis based on (i) a time difference between an output time of previous event data and an output time of subsequent event data, which are output from the imaging element during the unit time period, and (ii) at least one of a polarity of the previous event data or a polarity of the subsequent event data.