The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Apr. 24, 2024
Applicant:

Trumpf Laser Gmbh, Schramberg, DE;

Inventors:

Stefan Braun, Schramberg, DE;

Jan-Patrick Hermani, Markgroeningen, DE;

Martin Stambke, Dunningen, DE;

Assignee:

TRUMPF LASER SE, Schramberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02091 (2022.01); B23K 26/03 (2006.01); G01B 9/02055 (2022.01);
U.S. Cl.
CPC ...
G01B 9/02091 (2013.01); G01B 9/0207 (2013.01); B23K 26/03 (2013.01);
Abstract

A method for adjusting a reference section of an optical coherence tomography (OCT) system includes providing the OCT system, generating a measuring beam using the OCT system, conducting the measuring beam to a measurement object, generating a reference beam using the OCT system, conducting the reference beam through the reference section, superimposing the measuring beam reflected from the measurement object and the reference beam, registering interference signals between the measuring beam and the superimposed reference beam using an interferometer of the OCT system, dividing a scanning path of the measuring beam into measurement phases and positioning phases, and adjusting the reference section exclusively in the positioning phases.


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