The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Aug. 16, 2022
Applicant:

Boston Scientific Scimed, Inc., Maple Grove, MN (US);

Inventors:

Abhijit Kadrolkar, St. Paul, MN (US);

Troy E. Jackson, Rogers, MN (US);

Assignee:

BOSTON SCIENTIFIC SCIMED, INC., Maple Grove, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/024 (2006.01); G16H 40/67 (2018.01); G16H 50/30 (2018.01);
U.S. Cl.
CPC ...
A61B 5/7275 (2013.01); A61B 5/02405 (2013.01); G16H 40/67 (2018.01); G16H 50/30 (2018.01);
Abstract

An example system includes an implantable medical device configured to obtain measurement values of one or more patient metrics; and processing circuitry configured to: determine a baseline value for each of the respective one or more patient metrics based on measurement values of the one or more patient metrics over a first period of time; determine a short-term value for each of the one or more patient metrics based on measurement values of the one or more patient metrics over a second period of time, determine a difference between each of the short-term values and the respective baseline value for each of the one or more patient metrics; determine that a risk of an adverse event occurring in the patient is high in response to the determined difference meeting a respective adverse event risk threshold; and generate for output an adverse event high risk alert.


Find Patent Forward Citations

Loading…