The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2026
Filed:
Apr. 02, 2020
Starkey Laboratories, Inc., Eden Prairie, MN (US);
Justin R. Burwinkel, Eden Prairie, MN (US);
Buye Xu, Sammamish, WA (US);
Jason A. Galster, Studio City, CA (US);
Lauren Petley, Cincinnati, OH (US);
Peter J. Tetrick, Chaska, MN (US);
Sourav K. Bhunia, Shoreview, MN (US);
Peggi S. Cross, Tucson, AZ (US);
Martin Mckinney, Minneapolis, MN (US);
Starkey Laboratories, Inc., Eden Prairie, MN (US);
Abstract
Various embodiments of a monitoring system are disclosed. The monitoring system includes first and second sensors each adapted to detect a characteristic of a subject of the system and generate data representative of the characteristic of the subject, and a controller operatively connected to the first and second sensors. The controller is adapted to receive data representative of first and second characteristics of the subject from the first and second sensors, and determine statistics for first and second condition substates of the subject over a monitoring time period based upon the data received from the first and second sensors. The controller is further adapted to compare the statistics of the first and second condition substates, confirm the first condition substate if it is substantially similar to the second condition substate, and determine the statistics of an overall condition state of the subject based upon the confirmed first condition substate.