The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2026
Filed:
May. 06, 2022
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Yasuhisa Kaneko, Kanagawa, JP;
Tomohide Hiragami, Kanagawa, JP;
Kenji Nagamiya, Kanagawa, JP;
Nobuya Kitamura, Kanagawa, JP;
Yasuyuki Hosono, Kanagawa, JP;
Assignee:
FUJIFILM CORPORATION, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/0205 (2006.01); A61B 5/00 (2006.01); A61B 5/021 (2006.01); A61B 5/1455 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0205 (2013.01); A61B 5/021 (2013.01); A61B 5/14551 (2013.01); A61B 5/6801 (2013.01);
Abstract
A measurement system comprising: a first measurement apparatus including at least a first processor; and a second measurement apparatus including at least a second processor, wherein the first processor and the second processor are configured to measure biological information of a user by synchronizing a timing with each other.
Kaneko, Yasuhisa. (2026). Measurement system, measurement method, and measurement program (U.S. Patent No. 12661016). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12661016
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile