The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

May. 07, 2020
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Chia Cheng Chin, Fremont, CA (US);

Abhishek Dube, Fremont, CA (US);

Yi-Chiau Huang, Fremont, CA (US);

Saurabh Chopra, Santa Clara, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 25/16 (2006.01); C30B 25/02 (2006.01); C30B 25/04 (2006.01); C30B 25/18 (2006.01); C30B 25/20 (2006.01); C30B 29/52 (2006.01); H10D 30/01 (2025.01); H10D 30/62 (2025.01); H10D 30/69 (2025.01); H10D 62/13 (2025.01); H10D 62/40 (2025.01); H10D 62/832 (2025.01); H10D 62/834 (2025.01); H10P 14/20 (2026.01); H10P 14/24 (2026.01);
U.S. Cl.
CPC ...
H10P 14/3466 (2026.01); C30B 25/02 (2013.01); C30B 25/04 (2013.01); C30B 25/16 (2013.01); C30B 25/186 (2013.01); C30B 25/205 (2013.01); C30B 29/52 (2013.01); H10D 30/024 (2025.01); H10D 30/6211 (2025.01); H10D 30/797 (2025.01); H10D 62/151 (2025.01); H10D 62/405 (2025.01); H10D 62/832 (2025.01); H10D 62/834 (2025.01); H10P 14/20 (2026.01); H10P 14/24 (2026.01); H10P 14/3411 (2026.01); H10P 14/3444 (2026.01);
Abstract

Generally, examples described herein relate to methods and semiconductor processing systems for anisotropically epitaxially growing a material on a silicon germanium (SiGe) surface. In an example, a surface of silicon germanium is formed on a substrate. Epitaxial silicon germanium is epitaxially grown on the surface of silicon germanium. A first growth rate of the epitaxial silicon germanium is in a first direction perpendicular to the surface of silicon germanium, and a second growth rate of the epitaxial silicon germanium is in a second direction perpendicular to the first direction. The first growth rate is at least 5 times greater than the second growth rate.


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