The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Jul. 08, 2021
Applicant:

Iray Technology Company Limited, Shanghai, CN;

Inventors:

Yimin Huang, Shanghai, CN;

Chenglin He, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/42 (2006.01);
U.S. Cl.
CPC ...
H05G 1/42 (2013.01);
Abstract

An automatic X-ray exposure control method and system are disclosed. The method comprises: turning on a flat-panel detector, setting parameters of the flat-panel detector, and selecting one or more exposure radiation fields of the flat-panel detector; testing a corresponding exposure dose obtained by scanning the exposure radiation fields in real time, and determining that an exposure has started when the tested exposure dose is greater than a first preset threshold; configuring the flat-panel detector such that it enters an automatic exposure control mode when the exposure is started and triggers a cut-off signal; configuring the flat-panel detector such that it triggers an image acquisition when the exposure is completed. The present disclosed method and system can simplify the structure, reduce the cost, and effectively avoid exposure dose errors caused by line delays and other problems. Meanwhile, it also shortens the image acquisition cycle and reduces the complexity of operation.


Find Patent Forward Citations

Huang, Yimin. (2026). Automatic exposure control method and system for x-ray (U.S. Patent No. 12660072). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12660072

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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