The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Jan. 12, 2024
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Matthias Ruengeler, Kirchheim, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
The invention relates to a measurement system for measuring an intercept point, IPx, value of a device-under-test, DUT. The system includes: an input port arranged for being directly or indirectly connected to the DUT; and a measurement unit which is connected to the input port. The input port is configured to receive a first CW signal, a second CW signal, and at least one intermodulation signal of the first and the second CW signal from the DUT, and to forward the signals to the measurement unit. The measurement unit is configured to perform an IPx measurement. The IPx measurement includes measuring a signal level of at least one or both of the first and the second CW signal, and measuring a signal level of the at least one intermodulation signal. The measurement unit is operable in a first operating mode and/or in a second operating mode.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile