The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Mar. 11, 2025
Magnolia Blue Corporation, Tokyo, JP;
Shinichiro Hashimoto, Tokyo, JP;
MAGNOLIA BLUE CORPORATION, Tokyo, JP;
Abstract
An inspection method includes: obtaining a one-dimensional luminance profile by performing image processing of compressing a luminance of an inspection image of a pixel region of a display panel captured by an imaging device, into a one-dimensional luminance; generating a frequency spectrum intensity profile by performing Fourier transform on the one-dimensional luminance profile; calculating, based on a periodic structure of pixels shown in the pixel region, an imaging magnification of the imaging device from one or more peak positions included in the frequency spectrum intensity profile; and estimating a current focus position from the imaging magnification calculated and magnification information indicating a relationship between a focus position and an imaging magnification of the imaging device, the current focus position being a focus position of the imaging device in the inspection image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile