The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Dec. 18, 2020
Korea Electronics Technology Institute, Seongnam-si, KR;
Jeong Hoon Kang, Seoul, KR;
Hyo Sub Choi, Yongin-si, KR;
Changwoo Kim, Siheung-si, KR;
Chulseoung Chae, Gunsan-si, KR;
Korea Electronics Technology Institute, Seongnam-si, KR;
Abstract
An on-device based data analysis system and a method are proposed. According to specific examples of the system and method, when a size of measurement data collected from sensors, processes, or various equipment according to a user request is greater than or equal to an upper limit of a predetermined range of an on-device resource usage rate, the collected measurement data is transmitted to a cloud server to perform noise removal, pre-processing, and analysis on the measurement data on a cloud-basis, and when the size of the measurement data is within the predetermined range of the on-device resource usage rate or is less than a lower limit, the noise removal, pre-processing, and analysis is performed on the measurement data on an on-device basis, so that distributed processing between the on-device processing device and the cloud server is performable, whereby loads on the cloud server may be reduced.