The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Dec. 29, 2022
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Kazushi Yamashina, Tokyo, JP;

Tetsuji Ohsawa, Tokyo, JP;

Yuichiro Shiga, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 43/0823 (2022.01); H04L 1/00 (2006.01);
U.S. Cl.
CPC ...
H04L 43/0823 (2013.01); H04L 1/0061 (2013.01);
Abstract

The present invention addresses the problem of inferring the cause of a fault in a distributed system configured from a plurality of distributed devices. A distributed system configured from a plurality of distributed devices capable of communicating over a communication channel, wherein each of the distributed devices has: a communication port for receiving a communication signal from another distributed device; a storage unit for storing device information which expresses properties of the distributed system; and an inspection unit for detecting a communication error via the communication signal, indicating said communication error, and inferring the cause of the communication error by comparing the device information with the communication error information, which includes the time when the communication error occurred, the communication error type and the place where the communication error was detected.


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