The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Jun. 07, 2023
Aptiv Technologies Ag, Schaffhausen, CH;
Zhengzheng Li, Agoura Hills, CA (US);
Shuimei Zhang, Oak Park, CA (US);
Yu Zhang, Thousand Oaks, CA (US);
Xin Zhang, Agoura Hills, CA (US);
Aptiv Technologies AG, Schaffhausen, CH;
Abstract
This document describes techniques and systems for target testing based on raw uncalibrated radar data. Channel responses (e.g., Raw radar data) are obtained from a sensor having a Multiple-input multiple-output (MIMO) antenna array. The channel responses, based on target detections, are arranged in a MIMO measurement matrix. The dominant singular values of the observation matrix are determined, and the quantity of dominant singular values is compared to the number of targets, either from prior information or estimated after calibration, in the FOV of the sensor. If the number of dominant singular values is different than the number of targets, either from prior information or estimated after calibration, then further analysis may be used to determine the cause of the difference. In this manner, potential damaged sensors or degradation from cover reflections may be identified, sensor status independent of calibration may be monitored, and calibration may be improved.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile