The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Sep. 20, 2022
Applicant:

Boe Technology Group Co., Ltd., Beijing, CN;

Inventors:

Tong Liu, Beijing, CN;

Zeyu Shangguan, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/764 (2022.01); G06T 7/11 (2017.01); G06V 10/44 (2022.01);
U.S. Cl.
CPC ...
G06V 10/764 (2022.01); G06T 7/11 (2017.01); G06V 10/44 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20132 (2013.01);
Abstract

Disclosed is a method for training an image processing model. The method includes acquiring a plurality of original image sets; cropping the plurality of original images in the plurality of original image sets to acquire a training sample set, wherein each of the training samples represents one original image, or a subimage acquired by cropping one original image; determining a plurality of positive sample pairs and a plurality of negative sample pairs from the training sample set, wherein each of the positive sample pairs comprises two training samples acquired based on different said original images in the same original image set, and each of the negative sample pairs comprises two training samples acquired based on the original images in different said original image sets; and training the image processing model based on the plurality of positive sample pairs and the plurality of negative sample pairs.


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