The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Aug. 08, 2024
Applicant:
Xrpro, Llc, Boulder, CO (US);
Inventors:
Kazi Miftahul Hoque, Jashore, BD;
Paulo E. Xavier Da Silveira, Boulder, CO (US);
Anton Aleksandrovich Tokar, Longmont, CO (US);
Isobel Jane Mulligan, Niwot, CO (US);
Dmitrii Aleksandrovich Gladyshev, Longmont, CO (US);
Ravi Vibhakar Shah, Boulder, CO (US);
Assignee:
XRPro, LLC, Boulder, CO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/20 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 17/20 (2013.01); G06T 7/0002 (2013.01); G06T 2207/30168 (2013.01);
Abstract
A system for determining a quality metric of a three-dimension mesh generated from a scan of an object. In some cases, the system may utilize a representative object to determine the one or more quality metrics. The quality metric may indicate a usability of the three-dimensional mesh for an operation, such as generation of a prosthetic, surgery, or the like.