The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Oct. 13, 2022
Applicant:

Intuitive Surgical Operations, Inc., Sunnyvale, CA (US);

Inventors:

Timothy D. Soper, San Jose, CA (US);

Vincent Duindam, San Francisco, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/33 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/33 (2017.01); G06T 7/73 (2017.01); G06T 2207/10072 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20104 (2013.01); G06T 2207/30061 (2013.01); G06T 2207/30101 (2013.01); G06T 2207/30172 (2013.01);
Abstract

A system is configured to perform operations includes accessing a set of model points of a model of an anatomic structure of a patient, the model points being associated with a model space. A set of measured points of the anatomic structure of the patient are collected, the measured points being associated with a patient space. The set of model points are registered to the set of measured points using a first set of initial parameters to generate a first transformation. One or more sets of perturbed initial parameters are generated based on the first set of initial parameters. One or more perturbed registration processes are performed to register the set of model points to the set of measured points using the one or more sets of perturbed initial parameters respectively to generate corresponding perturbed transformations. A registration quality indicator is generated based on the first transformation and the one or more perturbed transformations.


Find Patent Forward Citations

Loading…