The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Nov. 18, 2022
Jfe Steel Corporation, Tokyo, JP;
JFE Steel Corporation, Tokyo, JP;
Abstract
An apparatus and a method for measuring granular objects, an abnormality detection method, and a method for producing granular iron are provided. An apparatus for measuring granular objects thrown into a liquid surface, the apparatus including an imaging device configured to continuously image the liquid surface, and a processing unit configured to measure the granular objects from time-series image data of the liquid surface imaged by the imaging device, in which the processing unit is configured to perform dynamic mode decomposition from the imaging device and the time-series image data, select, as a measurement dynamic mode, a dynamic mode in which an emphasized point is a vibrating liquid surface among dynamic modes obtained by the dynamic mode decomposition, obtain a measurement vibration frequency as a vibration frequency of a dynamic mode eigenvalue in the measurement dynamic mode, and measure the granular objects based on the measurement vibration frequency.