The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Dec. 03, 2021
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Thomas Koehler, Norderstedt, DE;

Bernhard Johannes Brendel, Norderstedt, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16H 30/40 (2018.01); G06T 5/77 (2024.01);
U.S. Cl.
CPC ...
G06T 5/77 (2024.01); G16H 30/40 (2018.01); G06T 2207/10081 (2013.01);
Abstract

A mechanism for generating an artefact estimation image that represents the effect of cone-beam artefacts in a computed tomography (CT) image. This is achieved by identifying the position of gradients (being sudden changes of intensity) in an axis of the CT image parallel to a rotation axis of the CT system that generated the CT image, where each gradient represents a source of a cone-beam artefact. A look-up table is used to individually identify the effect of a cone-beam artefact on areas surrounding each identified position of the gradient, to generate an artefact estimation image.


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