The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Aug. 11, 2023
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Hiroaki Yamamoto, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/4053 (2024.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 3/4053 (2013.01); G06T 7/0016 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30168 (2013.01);
Abstract

Provided is an information processing apparatus that acquires image data from an imaging apparatus including a light source and an imaging sensor and generating the image data by capturing an interference fringe image generated by irradiating an observation object with illumination light, and processes the acquired image data. The information processing apparatus includes a processor. The processor is configured to: extract a feature amount from the image data; and determine a quality of the interference fringe image included in the image data based on the feature amount.


Find Patent Forward Citations

Yamamoto, Hiroaki. (2026). Executing reconstruction of interferometric phase microscopy images based on interference fringe quality (U.S. Patent No. 12657658). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12657658

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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