The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

May. 10, 2022
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Hong Xuan, Bellevue, WA (US);

XI Chen, Bellevue, WA (US);

Saurajit Mukherjee, Kirkland, WA (US);

Li Huang, Sammamish, WA (US);

Kun Wu, Bellevue, WA (US);

Arun Kumar Sacheti, Sammamish, WA (US);

Kamal Ginotra, Kirkland, WA (US);

Meenaz Aliraza Merchant, Kirkland, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/084 (2023.01); G06N 3/045 (2023.01);
U.S. Cl.
CPC ...
G06N 3/084 (2013.01); G06N 3/045 (2023.01);
Abstract

A computer-implemented technique performs machine learning that bypasses the traditional design of loss functions. The technique includes receiving plural instances of gradient objective information. Each of the plural instances includes a particular combination of plural gradient elements. The technique produces plural sets of machine-trained parameter values using the plural respective instances of gradient objective information. The technique performs this operation based on the plural instances of gradient objective information as given, without calculating the plural instances of gradient objective information using loss functions. The technique then measures performance of the plural sets of machine-trained parameter values in an application system. Based on the measured performance, the technique provides output information that identifies a particular set of machine-trained parameter values that satisfies a prescribed test.


Find Patent Forward Citations

Loading…