The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Nov. 10, 2021
Autodesk, Inc., San Francisco, CA (US);
Peter Meltzer, London, GB;
Amir Hosein Khas Ahmadi, Toronto, CA;
Pradeep Kumar Jayaraman, Toronto, CA;
Joseph George Lambourne, London, GB;
Aditya Sanghi, Toronto, CA;
Hooman Shayani, London, GB;
AUTODESK, INC., San Francisco, CA (US);
Abstract
In various embodiments, a style comparison application compares geometric styles of different three dimensional (3D) computer-aided design (CAD) objects. In operation, the style comparison application executes a trained neural network one or more times to map 3D CAD objects to feature map sets. The style comparison application computes a first set of style signals based on a first feature set included in the feature map sets. The style comparison application computes a second set of style signals based on a second feature set included in the feature map sets. Based on the first set of style signals and the second set of style signals, the style comparison application determines a value for a style comparison metric. The value for the style comparison metric quantifies a similarity or a dissimilarity in geometric style between a first 3D CAD object and a second 3D CAD object.